A course is the basic teaching unit, it's design as a medium for a student to acquire comprehensive knowledge and skills indispensable in the given field. A course guarantor is responsible for the factual content of the course.
For each course, there is a department responsible for the course organisation. A person responsible for timetabling for a given department sets a time schedule of teaching and for each class, s/he assigns an instructor and/or an examiner.
Expected time consumption of the course is expressed by a course attribute extent of teaching. For example, extent = 2 +2 indicates two teaching hours of lectures and two teaching hours of seminar (lab) per week.
At the end of each semester, the course instructor has to evaluate the extent to which a student has acquired the expected knowledge and skills. The type of this evaluation is indicated by the attribute completion. So, a course can be completed by just an assessment ('pouze zápočet'), by a graded assessment ('klasifikovaný zápočet'), or by just an examination ('pouze zkouška') or by an assessment and examination ('zápočet a zkouška') .
The difficulty of a given course is evaluated by the amount of ECTS credits.
The course is in session (cf. teaching is going on) during a semester. Each course is offered either in the winter ('zimní') or summer ('letní') semester of an academic year. Exceptionally, a course might be offered in both semesters.
The subject matter of a course is described in various texts.
NI-TSP Testing and Reliability Extent of teaching: 2P+2C Instructor: Fišer P. Completion: Z,ZK Department: 18103 Credits: 5 Semester: Z Annotation:
Students will gain knowledge about circuit testing and about methods for increasing reliability and security. They will get practical skills to be able to prepare a test set with the help of the intuitive path sensitization and to use an ATPG for automatic test generation. They will be able to design easily testable circuits and systems with built-in-self-test equipment. They will be able to compute, analyze, and control the reliability and availability of the designed circuits.
Lecture syllabus:
1. Introduction, terminology, defects, faults 2. Test generation for combinational circuits 3. Automatic Test Patterns Generation algorithms (ATPG) 4. Sequential circuits testing, fault simulation 5. Dependability, increasing dependability 6. Dependability models, dependability computation 7. Design for testability 8. Sequential circuit testing - scan design 9. Interconnect testing, SoC and NoC testing 10. Built-in self-test (BIST) 11. Test compression 12. Memory and FPGA testing Seminar syllabus:
1. Introduction to the course 2. Faults in digital circuits 3. Tests generation for combinational circuits, D-Algorithm 4. ATPG Atalanta, Boolean Differential calculus 5. SAT-based ATPG 6. Testing of sequential circuits 7. Reliability Block Diagrams 8. Markov reliability models 9. Fault Tree Analysis and other reliability models 10. Reliability standards 11. Assessment test, BIST design 12. Assessment Literature:
O. Novák, E. Gramatová, and R. Ubar, "Handbook of testing electronic systems". Praha: Publishing House of CTU, 2005. ISBN 80-01-03318-X. R. Velazco, D. McMorrow, J. Estela, "Radiation Effects on Integrated Circuits and Systems for Space Applications", Springer, 2019, ISBN: 978-3-030-04660-6, 401 p. Z. Navabi, "Digital System Test and Testable Design", Springer, 2011, ISBN 978-1-4419-7547-8, p. 435 L. D., Protheroe D., "Digital circuit testing and design for testability", in Design of Logic Systems, Springer, Boston, MA, ISBN: 978-0-412-42890-6, 1992 F. C. Wang, "Digital Circuit Testing: A Guide to DFT and Other Techniques", Elsevier, ISBN 978-0-12-734580-2, 1991, 228 p. F. da Silva, T. McLaurin, and T Waayers, "The Core Test Wrapper Handbook: Rationale and Application of IEEE Std. 1500", Frontiers in Electronic Testing, 2006-th Edition, Springer, ISBN 978-0387307510, 2006, 276 p. Requirements:
Digital IC design (BIE-SAP).
Informace o předmětu a výukové materiály naleznete na https://courses.fit.cvut.cz/NI-TSP/ The course is also part of the following Study plans:
Page updated 26. 4. 2024, semester: Z/2020-1, L/2021-2, L/2019-20, L/2022-3, Z/2019-20, L/2020-1, L/2023-4, Z/2022-3, Z/2021-2, Z/2023-4, Z/2024-5, Send comments to the content presented here to Administrator of study plans Design and implementation: J. Novák, I. Halaška